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JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working This UNIT Instruments UFC-8161 is

SKU: 67897705776

4.9
USD437.00 USD485.00

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Description

This UNIT Instruments UFC-8161 is used working surplus

Made in the USA This AMAT Applied Materials 0100-76130 Sensors Mux Board PCB 0130-76130 Ultima X is used working surplus

Removed from a Kokusai Electric Zestone V DD-1203V Vertical Diffusion Furnace This Kokusai Temperature Controller Nozzle and Clamp Line Zestone V is used working surplus

The physical condition of the unit is good and clean

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working This UNIT Instruments UFC-8161 isJEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items

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